PaulSnow t1_iu23xnr wrote on October 28, 2022 at 12:00 AM

Reply to comment by Natanael_L in I am the co-author behind ACM’s TechBrief on Election Security: Risk-limiting Audits. Ask me anything about election security! by TheOfficialACM

Your first link is just your post, and it doesn't mention x-raying anything.

The second mentions optical inspection and checking against "golden chips" isn't x-ray, and there is no reference to x-raying hardware here in the abstract. And I don't have a subscription to read the paper.

Natanael_L t1_iu2a0dm wrote on October 28, 2022 at 12:46 AM

https://spectrum.ieee.org/chip-x-ray

And optical inspection is common - and less capable in detecting attacks like manipulated silicon doping

PaulSnow t1_iu2kxqj wrote on October 28, 2022 at 2:09 AM

The article does not say they can detect doping. Their test was a flaw in a interconnect layer.

But great. You would do a statistical examination of batches of chips. Done. Their process is destructive.