Natanael_L t1_iu2a0dm wrote
Reply to comment by PaulSnow in I am the co-author behind ACM’s TechBrief on Election Security: Risk-limiting Audits. Ask me anything about election security! by TheOfficialACM
https://spectrum.ieee.org/chip-x-ray
And optical inspection is common - and less capable in detecting attacks like manipulated silicon doping
PaulSnow t1_iu2kxqj wrote
The article does not say they can detect doping. Their test was a flaw in a interconnect layer.
But great. You would do a statistical examination of batches of chips. Done. Their process is destructive.
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